**PREFACE**
Smits, J.M.M.; Behm, H.; Bosman, W.P.; Beurskens, P.T.
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**EXPRESS**
Enraf-Nonius EXPRESS. Enraf-Nonius diffractometer control software Release 5.1;
Enraf-Nonius: Delft, The Netherlands, 1994.
**PROFIEL-ANALYSE**
Grant, D.F.; Gabe, E.J. J. Appl. Crystallogr. 1978, 11, 114.
Lehman, M.S.; Larsen, F.K. Acta Crystallogr. 1974, A30, 580.
**EMPABS**
North, A.C.T.; Philips, D.C.; Mathews, F.S. Acta Crystallogr. 1968, A24, 351-359.
**CRUNCH**
Gelder, R. de; Graaff, R.A.G. de; Schenk, H. Acta Crystallogr. 1993, A49, 287-293.
**DIRDIF**
Beurskens, P.T.; Beurskens, G.; Bosman, W.P.; Gelder, R. de;
Garcia-Granda, S.; Gould, R.O.; Israel, R.; Smits, J.M.M.
DIRDIF-96. A computer program system for crystal structure determination by
Patterson methods and direct methods applied to difference structure factors;
Crystallography Laboratory, University of Nijmegen: The Netherlands, 1996.
**PATTERSON/ORIENT**
Beurskens, P.T.; Beurskens, G.; Strumpel, M.; Nordman, C.E. In Patterson
and Pattersons; Glusker, J.P.; Patterson, B.K.; Rossi, M., Eds.;
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**SIR97**
A. Altomare, M.C. Burla, M. Camalli, B. Carrozzini, G. L. Cascarano,
C. Giacovazzo, A. Guagliardi, A.G.G. Moliterni, G. Polidori & R. Rizzi.
J. Appl. Cryst. (1999), 32, 115-119.
**SHELXL-93**
Sheldrick, G.M. SHELXL-93. Program for the refinement of
crystal structures; University of Gottingen: Germany, 1993.
**FLACK-PARAMETER**
Flack, H.D. Acta Crystallogr. 1983, A39, 876.
**DIFABS**
Walker, N; Stuart, D. Acta Crystallogr. 1983, A39, 158.
**INTERNATIONAL TABLES**
International Tables for X-ray Crystallography, Vol. IV;
Kynoch Press: Birmingham, England, 1974.
**PLUTON**
Spek, A.L. PLUTON. A program for plotting molecular and crystal structures;
University of Utrecht: The Netherlands, 1995.
**PLATON**
Spek, A.L. Acta Crystallogr. 1990, A46, C-34.
**PLATON-93/ORTEP**
Spek, A.L. PLATON-93. Program for display and analysis of crystal and molecular
structures; University of Utrecht: The Netherlands, 1995.
**GEOM**
Motherwell, W.D.S. GEOM. A program for geometrical calculations;
Chemical Laboratory, University of Cambridge: England, 1976.
**PARST96**
Nardelli, M. Comput. Chem. 1983, 7, 95.
Nardelli, M. J. Appl. Crystallogr. 1995, 28, 659.
**Reduced (Niggli) Cell**
A Unified Algorithm for Determining the Reduced (Niggli) Cell.
Krivy, I. and Gruber, B. Acta Cryst. (1976). A32, 297-298.
**Unit Cell Comparison**
A Perturbation Stable Cell Comparison Technique.
Andrews, L.C., Bernstein, H.J. and Pelletier, G.A. Acta Cryst. (1980). A36, 248-252
**Bravais Lattice Invariants**
Bravais Lattice Invariants.
Andrews, L.C., Bernstein, H.J. Acta Cryst. (1995). A51, 413-416.
**Unit Cell Determination (Powder Indexing)**
Trial-and-error computer methods for the indexing of unknown powder patterns.
Werner,P.-E. Z. Kristallogr. (1964). 120, 375-387.
**TREOR: Unit Cell Determination (Powder Indexing)**
TREOR: a semi-exhaustive trial-and-error powder indexing program for all symmetries.
Werner,P.-E., Eriksson, L., Westdahl, M. J. Appl. Cryst. (1985). 18, 367-370.
**Unit Cell Determination (Powder Indexing)**
On the determination of unit-cell dimensions from powder diffraction patterns.
Wolff, P.M. de Acta Cryst. (1957). 10, 590-595.
**Structural Similarity**
Method of Crystal-Structure Similarity Searching
Dzyabchenko, A.V. Acta Cryst. (1994). B50, 414-425.
**Structural Similarity**
On Quantitative Relations among Crystal Structures
Burzlaff, H. and Rothammel, W. Acta Cryst. (1992). A48, 483-490.
**Structural Solution from Powder Data**
Whole-profile structure solution from powder diffraction data using
simulated annealing
Coelho, A.A. J. Appl. Cryst. (2000). 33, 899-908.